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. 2018 Mar 13;8:4410. doi: 10.1038/s41598-018-22200-4

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© The Author(s) 2018

Open Access This article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/.

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Structural characteristics of perforated nanomembranes. (a) SEM image of a warped perforated nanomembrane illustrating the surface topology of pores and depressions. Arrows indicate positions for membrane thickness approximation where it is folded without a gap in between. (b) SEM image of a membrane stretched out on a silicon wafer with a small ridge. The difference in length scale of the phase separated domains is clearly visible. (c) Photographs of membrane pieces floating on the surface of water (rectangular shapes) and a submerged piece (crumpled shape) (upper image), a membrane picked up on top of a silicon wafer held with tweezers (middle image) and a freely suspended membrane burdened with ~3 g of 2-propanol (lower image). (d) Higher magnification SEM image of a freely suspended membrane showing high contrast between membrane material and voids. The inset shows the edge of a membrane as viewed from the side. Scale bar: 200 nm (e) Higher magnification SEM micrograph showing a freely suspended perforated nanomembrane in tilted view. The background in the upper right corner visible in black and perforations appearing similarly dark are indicated by the arrows. (f) AFM image of the edge of a membrane on top of a silicon wafer. g, Height profile extracted from f corresponding to the white line.