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. 2018 Jan 26;8(2):68. doi: 10.3390/nano8020068

Figure 4.

Figure 4

Figure 4

Cross-sectional TEM micrographs of the ZnO NRs grown on SLs annealed in (a) vacuum, (b) air, and (c) nitrogen ambients. Bright-field images and their selected area electron diffraction (SAED) patterns are respectively shown in (top-left) and (top-right). Dark field images are shown according to each different diffraction condition of plane index in (bottom rows) with (top-center) their composite views in three different colors.