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. 2018 Feb 10;18(2):543. doi: 10.3390/s18020543

Figure 1.

Figure 1

(Left) SEM image of a Π-gate Si/SiGe MODFET under study; (Right) Zoom detailing the top view of the lateral structure of the metal gate, drain and source contacts. The Schottky-gate is placed in a slightly asymmetric position between the source and the drain on the device channel.