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. 2018 Feb 10;18(2):543. doi: 10.3390/s18020543

Figure 10.

Figure 10

(a) NEP of the strained-Si MODFET from measurements under an excitation of 150 GHz in the photovoltaic mode (Ids off) and for a bias source-to-drain current Ids = 5 μA; (b) same as (a) under an excitation of 300 GHz.