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. 2018 Mar 16;8:4710. doi: 10.1038/s41598-018-22983-6

Figure 2.

Figure 2

Thickness dependence of the quantity C = (ρ300/ρ10 − 1)−1. ρ300/ρ10 is the residual resistivity ratio (i.e. RRR). All films have been deposited on SiO2 substrates except for those indicated by yellow filled circles, deposited on sapphire.