Figure 2.
Thickness dependence of the quantity C = (ρ300/ρ10 − 1)−1. ρ300/ρ10 is the residual resistivity ratio (i.e. RRR). All films have been deposited on SiO2 substrates except for those indicated by yellow filled circles, deposited on sapphire.
Thickness dependence of the quantity C = (ρ300/ρ10 − 1)−1. ρ300/ρ10 is the residual resistivity ratio (i.e. RRR). All films have been deposited on SiO2 substrates except for those indicated by yellow filled circles, deposited on sapphire.