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. 2018 Mar 16;8:4710. doi: 10.1038/s41598-018-22983-6

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© The Author(s) 2018

Open Access This article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/.

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Dependence of the product of the film thickness, d, and the superconducting transition temperature, T_C, on the sheet resistance (R_s) for the investigated Nb nanofilms. The red line is the least-squares fit of the data obtained using Eq. (2). Inset reproduces the behavior of T_C (circles) and of R_S (squares) as a function of the thickness. Yellow filled symbols refer to samples deposited on sapphire substrates. Blue and black lines are guides for the eyes.