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. 2018 Mar 16;8:4710. doi: 10.1038/s41598-018-22983-6

Table 1.

The experimentally measured properties of different Nb nanofilms.

Sample Thickness (nm) width (μm) TC (K) ΔTC (mK) ρ300 (μΩ cm) RRR (ρ300/ρ10) μ0HC20 (T) ξ(0) (nm)
#9 9 50 6.462 50 118.2 1.827
#17 11 50 6.53 65 97.8 2.00
#12 12 50 6.475 30 135.7 1.893
#16 13 50 6.84 19 84.9 2.208
#H15 13.5 10 6.631 79 70.19 1.889
#H14S 13.5 10 7.313 75
#H1S 19.5 10 7.91 35 31.0 2.563
#H1 19.5 10 7.72 55 20.7 2.367 4.4 ± 0.10 7.77 ± 0.14
#H5 19.5 10 7.48 49 35.8 2.165
#H2 20.5 10 7.830 42 42.3 2.272
#H11S 22.5 10 8.108 28 28.4 3.191
#H9 22.5 10 7.888 44 30.1 2.675
#7 25 50 8.399 15 25.6 2.774
#H13 28 10 8.51 28 25.8 3.049
#H7 28 10 7.967 65 30.4 2.522
#H8 33 10 8.505 40 36.3 2.524 2.30 ± 0.03 11.3 ± 0.20
#3 34 50 8.585 16 21.1 3.186
#H6 35 10 8.519 29 20.9 3.432
#4 48 10 8.970 16 67.2 4.324
#H3 50 10 8.630 20 21.1 3.074
#5 62 50 8.927 10 57.9 4.103
#6 80 50 9.133 11 20.7 4.917
#H12 92 10 2.12 ± 0.016 11.5 ± 0.10

From left to right: Sample name (an S, following the number, indicates deposition on a sapphire substrate); Film thickness; width of the sample used for the electrical characterisation; TC; Superconducting transition width, ΔTC; Resistivity at 300 K; Resistivity ratio (RR) at 300 K and 10 K; Perpendicular critical magnetic field at 0 K; coherence length in the film plane at 0 K. For resistivity measurements, 1 μA of current intensity has been sourced to all films but #7 (50 μA); #5 (10 μA and 50 μA) and #6 (50 μA).