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. 2017 Oct 30;9(2):398–404. doi: 10.1039/c7sc02997g

Fig. 3. Characterizations of the ultrathin Pt nanoplates. (a) Low-magnification TEM image of the ultrathin Pt nanoplates. (b) TEM image of the ultrathin Pt nanoplates. The arrow indicates a defect. (c) HRTEM image of an individual ultrathin Pt nanoplate imaged with an electron beam perpendicular to the basal {111} facet. Inset: the typical ED pattern. Black and white arrows indicate the {220} and the formally forbidden 1/3{422} diffractions, respectively. (d) HRTEM image of a vertically aligned ultrathin Pt nanoplate. Lines indicate the alignment of the atoms along the [111] direction. Inset: a low-magnification TEM image.

Fig. 3