a) High Angle Annular Dark Field (HAADF) STEM image, b) STEM-based EDS element maps, and c) selected-area electron diffraction pattern of grain DOM-18. The outline of the grain is indicated on TEM image and EDS maps. The “RGB on HAADF” panel overlays a false-color combination of the Mg, Si, and Fe maps (red, green, blue, respectively) on the HAADF STEM image; the yellow color indicates grain is poor in Fe. The diffraction pattern indicates that it is crystalline olivine, with specific lattice planes indicated for two diffraction spots.