Table 1.
Simulated electron beam properties along the transport line
| Location | ||||||||
|---|---|---|---|---|---|---|---|---|
| Screen location | Source | First one | Before undulator | After undulator | ||||
| Slice (MeV) | ±1 | ±5 | ±1 | ±5 | ±1 | ±5 | ±1 | ±5 |
| σx (μm) | 0.6 | 0.6 | 1830 | 1830 | 575 | 748 | 634 | 913 |
| σz (μm) | 1.0 | 1.0 | 509 | 509 | 242 | 392 | 207 | 433 |
| σs (μm) | 1.0 | 1.0 | 9 | 9 | 17 | 72 | 18 | 73 |
| εnx (mm.mrad) | 1.0 | 1.0 | 58 | 93 | 58 | 92 | 58 | 92 |
| εnz (mm.mrad) | 1.0 | 1.0 | 15 | 31 | 15 | 30 | 15 | 28 |
Numerical computations assuming a flat-top beam distribution, σδ = 1.64% (±5 MeV) and σδ = 0.33% (±1 MeV), using the measured divergences from Fig. 2a