Figure 2.

Characterization of fabricated antidot arrays in few-layer BP. (a) Optical image of columnar regions with (1) pristine few-layer BP, (2) patterned antidots (SC = 60 nm and R = 23 nm), (3) P_xO_y, (4) bare SiO₂/Si substrate, and (5) pristine few-layer BP. (b) Raman spectra of (1) pristine few-layer, (2) antidot, and (3) P_xO_y regions normalized to the ${\mathrm{A}}_{\mathrm{g}}^1$ peak of (1), showing suppression of the in-plane modes (B_2g and ${\mathrm{A}}_{\mathrm{g}}^1$) in the antidot region. (c) SEM image of a square antidot array with SC = 65 nm and R = 13 nm. (d) ${\mathrm{B}}_{2\mathrm{g}}:{\mathrm{A}}_{\mathrm{g}}^1$ intensity Raman map from the sample in (a). Note: SC is the average in-plane superlattice constant and R is the average antidot radius.