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. Author manuscript; available in PMC: 2018 Apr 11.
Published in final edited form as: ACS Nano. 2017 Feb 1;11(2):1937–1945. doi: 10.1021/acsnano.6b08028

Figure 1.

Figure 1

Characterization of WS2 flakes. (a) Optical micrograph and (b) AFM scan of a monolayer WS2 flake. The line profile in white indicates a thickness of 0.7 nm, which corresponds to a monolayer. (c) Raman spectrum of monolayer WS2 flake with corresponding E′ (356 cm−1), A1′ (418 cm−1), and Si (521 cm−1) peaks. (d) Gaussian blur-filtered AC-HRSTEM lattice image taken at 80 kV. The inset is a SAED pattern with expected (100) and (110) diffraction spots.