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. 2018 Apr 25;9:1664. doi: 10.1038/s41467-018-03978-3

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© The Author(s) 2018

Open Access This article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/.

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Fig. 3 — Thermal characterization of PENF. a A PRT based micro-device with the heating and the sensing islands. Inset shows a PENF bridging the islands. b Total measured thermal resistance vs. L/A of crystalline (c) PENFs at 150 K and 300 K where the y-intercept represents 2R_c. The error bars show the mean and standard deviation values of 250 measurements. c k(T) of a PENF. Blue circles are measured k of a c-PENF, black dotted lines are after adjusting for 2R_c. Orange line is 1/T trend of c-PENF at high temperatures and pink line is T¹ trend at low temperatures. The error bars are obtained using error propagation in 2R_c and measured diameter (see Supplementary Note 4 for detailed uncertainty analysis). d k(T) of PEMF and amorphous (a) PENF. Red circles are PEMF before local drawing, and green circles are c-PENF amorphized due to exposure to FIB. e k(T) of all reported samples after adjusted for 2R_c. Scale bars, 20 µm and 2 µm (inset)