Figure 3.

Piezoelectric nanogenerator (NG) investigated with the atomic force microscopy (AFM) lateral bending method. (a) Experimental setup and procedures for generating electricity by deforming a vertically grown ZnO NW with a conductive AFM tip; (b) Simulation results of the longitudinal strain, corresponding piezoelectric induced electric field and potential for a bended ZnO NW; (c) The topography image of the measured ZnO NW array; (d) A series of line profiles of the voltage output signal when the AFM tip scanned across a vertical NW at a time interval of 1 min. Reproduced with permission from [5]. The American Association for the Advancement of Science, 2006.