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. 2018 Mar 27;8(4):196. doi: 10.3390/nano8040196

Figure 1.

Figure 1

(a) pulsed electromagnetic field (PEMF) exposure setup; (b) Current signal feeding the coil; (c) Model of the high-Tm MLs exposure system in the frontal exposure view; (d) Magnetic field distribution in the high-Tm MLs sample given by the magnetic field intensity of the coil (streamlines).