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. 2018 Apr 20;4(4):eaaq1202. doi: 10.1126/sciadv.aaq1202

Fig. 3. Low-dose image acquisition empowered by patterned in situ focusing aides.

Fig. 3

(A) Magnified view of five-window chip with grid bar patterning. (B) In situ image of grid bars over a window once assembled in a commercial LC-TEM holder. (C) Demonstration of low-dose capability allowed by using grid bars as focusing aids. Optimal focus is found on grid bars followed by imaging the sample area in a single shot with minimal previous electron exposure. Scale bars, 500 μm (A), 20 μm (B), 10 μm (C, Search), 500 nm (C, Focus), and 500 nm (C, Acquire).