Fig. 4. Amorphous limit sampling error as a function of sample size estimated for four different systems.

The values of amorphous limits are also given in parentheses in electron volts per atom for comparison with the errors. The error in the amorphous limit due to limited sampling is mostly independent of the value of the amorphous limit. The error is “fail-safe” for materials discovery applications because it is guaranteed to be in only one direction, that is, the actual amorphous limit can only be lower than the limit found by a sample size of n, which prevents excluding potentially revolutionary functionality that is still synthesizable. See Supplementary Text and fig. S84 for further details.