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. 2018 May 2;8:6924. doi: 10.1038/s41598-018-25057-9

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© The Author(s) 2018

Open Access This article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/.

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(a) Side view of the modelling geometry; a plane wave is incident upon a single aperture placed on top of a dielectric. (b) The permittivity recovered from our model for three different dielectric thicknesses of 30, 50 and 125 μm. The fields processed for the permittivity are due to the complex summation of the far fields transmitted through apertures of sizes from 40 to 700 μm.