| Crystal data |
| Chemical formula |
C32H53N3O |
|
M
r
|
511.77 |
| Crystal system, space group |
Monoclinic, C2 |
| Temperature (K) |
100 |
|
a, b, c (Å) |
20.1130 (15), 10.3898 (7), 15.5934 (12) |
| β (°) |
97.452 (2) |
|
V (Å3) |
3231.0 (4) |
|
Z
|
4 |
| Radiation type |
Mo Kα |
| μ (mm−1) |
0.07 |
| Crystal size (mm) |
0.35 × 0.30 × 0.24 |
| |
| Data collection |
| Diffractometer |
Bruker D8 Venture Photon 100 CMOS |
| Absorption correction |
Multi-scan (SADABS; Bruker, 2016 ▸) |
|
T
min, T
max
|
0.688, 0.746 |
| No. of measured, independent and observed [I > 2σ(I)] reflections |
85013, 8040, 7629 |
|
R
int
|
0.029 |
| (sin θ/λ)max (Å−1) |
0.670 |
| |
| Refinement |
|
R[F
2 > 2σ(F
2)], wR(F
2), S
|
0.044, 0.122, 1.02 |
| No. of reflections |
8040 |
| No. of parameters |
363 |
| No. of restraints |
5 |
| H-atom treatment |
H-atom parameters constrained |
| Δρmax, Δρmin (e Å−3) |
0.46, −0.31 |
| Absolute structure |
Flack x determined using 3430 quotients [(I
+)−(I
−)]/[(I
+)+(I
−)] (Parsons et al., 2013 ▸) |
| Absolute structure parameter |
0.1 (3) |
