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. Author manuscript; available in PMC: 2019 Jan 31.
Published in final edited form as: ACS Appl Mater Interfaces. 2018 Jan 16;10(4):3200–3209. doi: 10.1021/acsami.7b09071

Figure 1.

Figure 1

Thermal oxidation decreases the size of the Si skeletal core and increases the thickness of the SiO2 shell. (a) Top: Photographs of thermally treated porous silicon microparticles as a function of thermal oxidation time. The brownish color observed derives from the crystalline Si core, which is completely oxidized when the material is treated at a temperature of 800 °C for 1 h (“Full Oxidized”). Middle: The particles illuminated with UV (365 nm) light display differing degrees of luminescence intensity. Only the partially oxidized particles displayed detectable photoluminescence. Values of dSi indicate average size of the luminescent Si features, estimated from eq 1. Bottom: A schematic depicting the proposed nanostructural changes is shown below the relevant images; the crystalline Si core decreases in diameter and the SiO2 shell increases in thickness with increasing extent of oxidation. (b) Relative photoluminescence spectra of the pictured samples (λex = 365 nm, 500 nm long-pass filter). The photoluminescence spectra exhibit a blue shift as the Si core oxidizes, corresponding to a reduction in average size of the crystalline Si domains in the sample.