Fig. 3.

Comparison of atomic charges and self-organization of the anion-based layers under ambient conditions. a Calculated atomic charges (highest and lowest values)⁷⁴ of boron and halogen atoms obtained using different population analysis methods (Natural Population Analysis (NPA) and CHarges from ELectrostatic Potentials using a Grid-based method (CHELPG)) and b bright field optical microscopy images (scale bars=540 µm) showing layer morphology after soft landing of the family of [B₁₂X₁₂]²⁻ ions on FSAM. For X=Br, I, the layers were stable and did not change over a timeframe of days, while dewetting was observed for X=F, Cl. The initial stage of hole formation and final stage (after droplet formation) are shown. AFM images (scale bar=15 µm) of the droplets formed in the final stage showing a liquid-like droplet for X=Cl and a droplet with a solid-like grainy morphology for X=F