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. 2015 Nov 4;7(2):896–904. doi: 10.1039/c5sc03807c

Table 4. Mobility data of the HOD and EOD a .

Base material μ (cm2 V–1 s–1) (neat)
μ (cm2 V–1 s–1) (doped)
Hole Electron Hole Electron
CBP 2.1 × 10–4 1.9 × 10–4 2.3 × 10–5 6.8 × 10–5
5Me-[5]CMP 2.2 × 10–5 2.0 × 10–5 9.3 × 10–7 2.5 × 10–5
3Me-[6]CMP 4.4 × 10–5 6.0 × 10–5 1.2 × 10–5 6.7 × 10–5
6Me-[6]CMP 1.1 × 10–5 2.4 × 10–5 6.7 × 10–6 3.2 × 10–5

aThe mobilities were estimated at 100 mA cm–2 from JV2 characteristics using Child's law (J = 9εμV2/8L3) for the neat layers and doped layers.