Table 4. Mobility data of the HOD and EOD a .
Base material |
μ (cm2 V–1 s–1) (neat) |
μ (cm2 V–1 s–1) (doped) |
||
Hole | Electron | Hole | Electron | |
CBP | 2.1 × 10–4 | 1.9 × 10–4 | 2.3 × 10–5 | 6.8 × 10–5 |
5Me-[5]CMP | 2.2 × 10–5 | 2.0 × 10–5 | 9.3 × 10–7 | 2.5 × 10–5 |
3Me-[6]CMP | 4.4 × 10–5 | 6.0 × 10–5 | 1.2 × 10–5 | 6.7 × 10–5 |
6Me-[6]CMP | 1.1 × 10–5 | 2.4 × 10–5 | 6.7 × 10–6 | 3.2 × 10–5 |
aThe mobilities were estimated at 100 mA cm–2 from J–V2 characteristics using Child's law (J = 9εμV2/8L3) for the neat layers and doped layers.