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. 2018 May 16;13:153. doi: 10.1186/s11671-018-2569-3

Fig. 3.

Fig. 3

(a)-(d) Corresponding normalized electric field intensity (E/Ein) on the xoz plane across the center of the SiO spacer for the resonance wavelengths of λ , λ , λ , and λ labeled in Fig. 2. Red arrows represent the field direction, and colors show the field strength