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. 2016 Jan 12;7(3):1690–1695. doi: 10.1039/c5sc04425a

Fig. 1. Scanning electron microscope (SEM) images of (a) ZIF-67/GO and (b) CoP/rGO-400. (c) Transmission electron microscopy (TEM) and (d) high-resolution TEM images of CoP/rGO-400 (inset in (d): SAED pattern for CoP nanocrystal).

Fig. 1