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. 2018 May 25;8:8093. doi: 10.1038/s41598-018-26461-x

Figure 10.

Figure 10

Representative images of the [Cu]/[Te] = 2.0 film obtained by AFM and KPFM of a crystal cluster. (a) Topographic image obtained on tapping mode. (b) Height profile of the indicated line. (c) Surface potential distribution. (d) Surface potential profile along the indicated line.