Table 1.
Microscope | JEM3200FSC |
Voltage (kV) | 300 |
Energy filter slit width (eV) | 30 |
Detector | Gatan K2 Summit |
Magnification | 30,000X |
Pixel size (Å) | 1.2 |
Defocus range (μm) | 0.5 – 2.0 |
Electron exposure (e−/Å2) | 24 |
Micrographs (acquired/used) | 1266 / 1113 |
Segment step (asymmetric unit) | 5 |
Number of segments/asymmetric unit | 169,526 / 847,630 |
Helical twist and rise (°/Å) | −8.53 / 2.65 |
Map resolution at 0.143 FSC criterion (Å) | 5.8 |