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. 2014 Nov 13;39(3):167–188. doi: 10.1177/0146621614554650

Table 9.

Average Test Administration Time per Examinee (J = 10, HD-LV, and DINA).

PWKL MPWKL GDI
Time (in ms) 6.43 20.18 4.53
Ratio (relative to GDI) 1.42 4.45

Note. HD-LV = high discrimination–low variance; DINA = deterministic inputs, noisy “and” gate; PWKL = posterior-weighted Kullback–Leibler index; MPWKL = modified posterior-weighted Kullback–Leibler index; GDI = G-DINA model discrimination index; G-DINA = generalized DINA.