Figure 1: Transcatheter Aortic Valve Implantation With Early- and New-generation Devices in Bicuspid Aortic Valve Stenosis.

Top: In comparing clinical outcomes of the early- and new-generation devices, moderate or greater paravalvular leak was less frequent and device success rate was higher with new-generation devices. However, there were no significant differences in new permanent pacemaker implantation, 30-day mortality, and early safety endpoint between groups. Bottom: Procedural outcomes improved with device advancement. Compared to the early-generation devices, the new-generation devices were associated with less frequent paravalvular leak; specific new-generation devices improved on rates of annulus rupture and second valve implantation as shown. Source: Yoon et al., 2016,[17] reprinted with permission from Elsevier.