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. 2018 Jun 12;8:8953. doi: 10.1038/s41598-018-27244-0

Figure 3.

Figure 3

(a) and (b) represent 2D and 3D AFM images of TGA@CdS QDs deposited on silicon substrate, respectively. (c) Height profiles along the line in (a). (d) Statistical analysis of the heights of TGA@CdS QDs measured by AFM.