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. 2018 Jun 19;9:2406. doi: 10.1038/s41467-018-04798-1

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© The Author(s) 2018

Open Access This article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/.

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Fig. 2 — Quantitative conductivity measurements using the NV center. Plotted is the metal-induced NV center relaxation rate Γ_metal as a function of NV distance d from 85-nm thick films of Ag (red squares), Al (blue circles), and Ti (black triangles). For each curve the intrinsic relaxation rate of the NV is measured and subtracted to isolate Γ_metal. The fits (solid curves) yield the conductivity values shown. Error bars correspond to the standard error in the fit to a full T₁ measurement at each point