Fig. 5. (a) Schematic setup for TPV test. (b) TPV spectra of raw-Ta3N5 (orange) and necked-Ta3N5 electrode (black) with dual exponential fitted curves (green dashed curves). The inset table shows the lifetimes of the two electrodes, respectively. (c) Equivalent circuit of the device. (d) The simplified circuit of (c). Rcontact is the serial resistance at the particle–substrate interfaces; Rbulk is the total resistance in Ta3N5 films including the resistance in Ta3N5 particles (Rcrystal) and at particle–particle interfaces (R); Cbulk is the capacity of the parallel-plate capacitor built by Ti and FTO.
