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. 2016 Mar 9;7(8):4832–4841. doi: 10.1039/c6sc00389c

Fig. 3. PXRD of BiOX (X = Cl, Br, I) films deposited on FTO glass from the AACVD reaction of BiX3/DMF in air at 300 °C along with simulated BiOX patterns. The asterisked peaks correspond to positions of reflections from the F : SnO (FTO) substrate.

Fig. 3