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. 2016 May 9;7(8):5537–5546. doi: 10.1039/c6sc00715e

Table 1. Quantification of RuP3 and NiP on the NiO electrodes (determined by ICP-OES) and photocurrents (AM1.5G filter, 100 mW cm–2 and λ > 400 nm) of the respective electrodes after 100 s CPPE at Eappl = 0.3 V vs. RHE at room temperature. RuP3 and NiP loading on ITO is also shown. Loading concentrations are reported for the geometrical surface area of the electrodes. a .

Composition RuP3/nmol cm–2 NiP/nmol cm–2 |j|/μA cm–2(a) |j|/μA cm–2(b)
NiO|RuP3 10.7 ± 0.3 0.51 3.0
NiO|RuP3NiP 9.4 ± 1.6 3.57 ± 0.61(c) 0.94 n.d.(d)
NiO|RuP3–Zr4+ 6.3 ± 2.2 0.76 7.62
NiO|RuP3–Zr4+NiP 6.3 ± 3.1 4.98 ± 3.54(c) 6.40 14.0
NiO|RuP3–(Zr4+NiP)2 n.d. n.d. 8.82 n.d.
NiO|(RuP3–Zr4+)2NiP n.d. n.d. 2.18 n.d.
ITO|RuP3NiP 37.6 ± 0.2 14.3 ± 0.2
ITO|RuP3–Zr4+ 53.2 ± 20.5
ITO|RuP3–Zr4+NiP 41.3 ± 20.3 19.2 ± 9.9

aMeasured in (a)the absence and (b)presence of DTDP as SEA. (c)Calculated value from RuP3 : NiP ratio on ITO. (d)Not determined.