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. 2016 Jun 9;7(9):6076–6082. doi: 10.1039/c6sc01611a

Fig. 4. (a) JV curves of TiO2-dAR (red) and TiO2-AR (green). (b) Cyclic voltammograms curves of TiO2-dAR (red) and TiO2-AR (green) in N2-purged 0.1 M HClO4. Scan rate: 50 mV s–1. (c) Transient absorption decay profiles of TiO2-dAR and TiO2-AR on the μs–ms timescale probed with a 550 nm excitation line at room temperature. A 75 W tungsten lamp and a Nd:YAG laser (355 nm) were used as the probe and the pump beam, respectively. (d) Schematic diagrams showing the possible charge transfer processes across the phase junction. The dotted arrows represent undesirable interface trapping/recombination processes.

Fig. 4