AAS	atomic absorption spectroscopy
AF4-ICP-MS	asymmetric flow field-flow fractionation inductively coupled plasma mass spectrometry
DFOM	dark field optical microscopy
DFOMS	dark field optical microscopy and spectroscopy
EDX	energy dispersive X-ray
FIB-SEM-EDX	focused ion beam scanning microscopy coupled with energy-dispersive X-ray spectroscopy
ICP-MS	inductively coupled plasma mass spectrometry
ICP-OES	inductively coupled plasma optical emission spectroscopy
LA-ICP-MS	laser ablation inductively coupled ion mass spectrometry
PIXE	proton induced X-ray emission
SEM	scanning electron microscopy
SIMS	secondary ion mass spectrometry
ToF-SIMS	time of flight-secondary ion mass spectrometry
SP-ICP-MS	single particle inductively coupled plasma mass spectrometry
STEM	scanning transmission electron microscopy
TEM	transmission electron microscopy
TEM-EDX	transmission electron microscopy coupled with energy-dispersive X-ray spectroscopy
XANES	X-ray absorption near edge structure spectroscopy
XAS	synchrotron X-ray absorption spectroscopy
XRF	X-ray fluorescence