Skip to main content
. 2018 Jun 16;8(6):442. doi: 10.3390/nano8060442

Figure 7.

Figure 7

Measurements of sample NbN25/A1. (a) R(T), found by fitting to I(V) taken with |I|10 nA. (b) I(V) at 330 mK. (c) Low-bias sweep at 330 mK, showing a critical voltage feature.