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. 2018 Jun 16;8(6):442. doi: 10.3390/nano8060442

Figure 8.

Figure 8

Measurements on sample NbN80/1. (a) R(T). Inset: the same data on an expanded scale showing the low-temperature region. (b) High-bias I(V) at 330 mK. (c) I(V) at three temperatures above and below Tc, 350 mK, 1.92 K and 12.98 K. In all sub-plots, lines join consecutive data points. Voltage- and current-offsets of −1.25 mV, 0.5 mV and −0.28 mV and 5.5 pA, 6.0 pA and 5.5 pA, respectively, have been subtracted from the respective datasets in (c). The slight hysteresis observed in the measurement at 12.98 K is not a property of the sample, but rather an artefact associated with carrying out the measurement relatively rapidly (see Section 3.2).