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. 2018 Jul 4;9:2608. doi: 10.1038/s41467-018-04986-z

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© The Author(s) 2018

Open Access This article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/.

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Fig. 3 — Degradation mechanism. a, Normalized luminance (L) and operation voltage at maximum η_A (V@ max η_A) vs. time for the ZnSe-QD and ZnS-QD devices operated at a constant current, and operation voltage vs. time of hole-only and electron-only ZnSe-QDs and ZnS-QDs based devices operated at a constant current. b Current efficiency (η_A) as a function of voltage for the ZnSe-QD and ZnS-QD devices measured before the lifetime test and after 20 h continuous operation. c Capacitance vs. voltage for the two devices measured before the lifetime test and after 20 h continuous operation