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. 2018 Jul 13;4(7):eaar7720. doi: 10.1126/sciadv.aar7720

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Copyright © 2018 The Authors, some rights reserved; exclusive licensee American Association for the Advancement of Science. No claim to original U.S. Government Works. Distributed under a Creative Commons Attribution NonCommercial License 4.0 (CC BY-NC).

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Fig. 2 — (A) Bright-field LEEM image of β′-In₂Se₃ surface taken by a tilted electron beam at 9.9 eV. Scale bar, 1.5 μm. (B) LEED patterns of the three domains. (C) Intensity profile of the subdiffraction spots between the (−1,0) and (0,−1) spots.