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. 2018 Jul 10;13:4029–4043. doi: 10.2147/IJN.S163956

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© 2018 Wang et al. This work is published and licensed by Dove Medical Press Limited

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The topography of Ti in different groups.

Notes: Ti implant was either P or anodized under 5 V (NT-30) and 20 V (NT-100), respectively. (A) The topography observation by FE-SEM. (B) The diameter distribution of TiO₂ nanotubes (NTs). (C) The topography observation by AFM. (D) Surface roughness of Ti in different groups quantified by AFM.

Abbreviations: AFM, atomic force microscope; FE-SEM, field emission scanning electron microscope; NT, nanotube; P, polished specimen; Sa, average height; Sq, root mean square height; Ti, titanium.