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. 2018 Jul 17;9:2767. doi: 10.1038/s41467-018-05166-9

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© The Author(s) 2018

Open Access This article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/.

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Fig. 4 — Probing the interfacial magnetism in the TI and antiferromagnet heterostructure. a Background-subtracted Mn L-edge XA spectra of a TI-capped (blue) and uncapped (red) MnTe films (300 K) alongside the representative normal incidence Mn L-edge XMCD of a capped sample (black) (15 K). The fact that the TI capping does not change the valence of Mn atoms from 2+ to 3+ suggests negligible Mn inter-diffusion. The spectra have been offset for clarity. b Comparison of Mn L-edge XMCD for capped and uncapped samples in normal incidence (15 K) probing the in-plane and out-of-plane ferromagnetic alignment of moments. The error bars are one standard deviation. c Antiferromagnetic order probed by XLD. Data give a comparison of Mn L-edge XLD for both capped and uncapped samples. The XMCD and XLD data suggest that the AFM order of the MnTe is not altered by the TI capping layer. d Fitted polarized neutron reflectometry of the TI/MnTe heterostructure measured at 7.5 K in a 700 mT in-plane applied field. e Spin asymmetry of the measurement with the fit shown in (d). Error bars represent one standard deviation. f Structural and magnetic depth profile are represented by the nuclear and magnetic scattering length densities (SLD) used to obtain the fit shown in (d) and (e). These polarized neutron reflectometry results (d, e, and f) suggest an interfacial ferromagnetic layer was induced in the TI/AFM heterostructure