Electron beam lithography |
Silicon and conductive materials. Requires electron-sensitive resist (i.e., PMMA) |
Below 10 nm |
Slow for scanning focused electron beam |
High-equipment cost (>$1 million) |
Serial for focused electron beam; batch processing possible for projection electron beam lithography; device-scale or wafer-scale |
Often used to create master mold for nano-imprint lithography |
Tseng et al., 2003; Dong et al., 2005a; Joo et al., 2006; Lee et al., 2007; Dalby et al., 2008; Yang and Leong, 2010; Scholten and Meng, 2016
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Nano-imprint lithography |
Silicon-based materials, metals, polymers |
2–100 nm |
Relatively fast to transfer pattern from mold to resist |
High cost of master mold, but overall cost is relatively low due to reusability of mold |
Batch processing; device-scale or wafer-scale |
Two broad categories: thermal NIL and ultraviolet NIL |
Chen and Ahmed, 1993; Schulz et al., 2000; Dong et al., 2005b; Guo, 2007; Li et al., 2011; Al-Abaddi et al., 2012; Choi et al., 2013; Eom et al., 2015; Baquedano et al., 2017
|
Focused ion beam lithography |
Silicon-based materials, metals, and polymers |
∼20 nm |
Slow rate of milling |
High-equipment cost (>$1 million) |
Serial processing on device-scale |
Direct write; flexible design and materials |
Watkins et al., 1986; Veerman et al., 1998; Lehrer et al., 2001; Reyntjens and Puers, 2001; Heyderman et al., 2003; Gabay et al., 2005; Kim et al., 2007; Lanyon and Arrigan, 2007; Raffa et al., 2008; Christopherson et al., 2009; Ziberi et al., 2009; Bechara et al., 2010; Dugan et al., 2010; Menard and Ramsey, 2010; Wang et al., 2017; Vermeij et al., 2018
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