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. 2018 Feb 23;7:17152. doi: 10.1038/lsa.2017.152

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Copyright © 2018 The Author(s)

This work is licensed under a Creative Commons Attribution 4.0 International License. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in the credit line; if the material is not included under the Creative Commons license, users will need to obtain permission from the license holder to reproduce the material. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/

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Silica microarray pattern detection with LIM: comparison of plasmonic and transparent substrates. (a) Color-coded OPD maps of various microarrayed silica (SiO₂) thicknesses patterned identically on plasmonic and transparent control substrates. (b) OPD contrast data statistically extracted (36 spots considered on each chip) from plasmonic and transparent microarray patterns are shown as a function of silica thickness, with the low thickness range magnified on the left. The top axis indicates the effective refractive index units of the corresponding thin silica films, for convenience. Baseline indicates the average OPD contrast of the bare substrate. Error bars correspond to standard deviation where N=36.