Figure 8.

Perspectives in sensing applications (benchmark MT). (a, b) Measured and simulated, respectively, reflectivity spectra in the absence (red-dashed curves) and presence (blue-solid curves) of a 40-nm-thick overlay of SiO_x. (c, d) Simulated electric-field magnitude map over a supercell (at y=0, nearby the MT) for the co-polarized and cross-polarized component, respectively, at λ = 1.62 μm, assuming a normally-incident x-polarized plane-wave illumination. (e, f) Corresponding longitudinal cuts at x = 0.265 μm. The inset shows the benchmark supercell. Fields are normalized with respect to the incident-field amplitude.