Skip to main content
. 2018 Jul 30;13(7):e0201529. doi: 10.1371/journal.pone.0201529

Fig 5. Intensity profiles of a rotated artifact.

Fig 5

Intensity profiles acquired in the absorbance optics after intentional rotation of the artifact by 5.7°. Due to the rotation, the pattern from the sample sector (blue) and the reference sector (magenta) almost superimpose, rather than showing the half pitch offset expected at perfect rotational alignment.