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. 2018 May 16;122(2):303–313. doi: 10.1093/aob/mcy068

Fig. 3.

Fig. 3.

Atomic force microscopy (AFM) and X-ray photoelectron spectroscopy (XPS) analysis of the cell wall (CW) of rice suspension cells. (A) AFM PeakForce and height images of the extracted cell wall from +Si and –Si cells. Arrows and circles show the cellulose fibrils are shorter and broken in –Si cells. (B) Average Young’s modulus of the cell wall. The horizontal lines of each box represent the 25th, 50th and 75th percentile values, and the whiskers outside the box extend to the 5th and 95th percentile values. Different lowercase letters indicate a significant difference at P < 0.05. (C) Diameter (averaged height) of cellulose microfibrils or bundles of microfibrils in the +Si and –Si cells measured along lines 1→1’ and 2→2’ in A by AFM. (D) XPS of the cell wall chemical composition for Si 2p. Values are means ± SD (n = 10).