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. 2018 Aug 1;8:11549. doi: 10.1038/s41598-018-30000-z

Figure 2.

Figure 2

(A) FTIR-ATR spectra for (un)treated silicon to verify surface treatment. (B) XPS survey scans of (un)treated silicon. Also shown are high resolution XPS spectra (grey) and fits for (C) carbon and (D) oxygen.