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. 2018 Aug 2;8:11623. doi: 10.1038/s41598-018-29977-4

Figure 2.

Figure 2

Chiral metasurface upon annealing: SEM-image of the surface, tilted by 52° view (a); three exemplary consecutive FIB cuts used for the 3D reconstruction (b); average surface relief within a unit cell resolved by AFM (c); profile of the Si/SiO2 interface resolved by 3D reconstruction (d); 3D model of the unit cell after annealing (e).