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. 2018 Aug 7;9:3118. doi: 10.1038/s41467-018-05611-9

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© The Author(s) 2018

Open Access This article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/.

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Fig. 1 — Thickness dependence of the Pt resistivity. Dependence of the Pt resistivity ρ_Pt on a the inverse thickness 1/d_Pt, b the thickness d_Pt. Note the logarithmic scale of y-axis. Filled circles show the experimental data, line shows the resistivity calculated using Eq. (23) from the literature²⁶ and values ρ_∞ = 40 µΩ cm, λ = 10 nm, p = 0.8, ζ = 0.25²⁶. Resistivity of the Pt films increased with the decreasing thickness due to increased contribution from the surface and grain boundaries scattering. See Supplementary Note 3 for further details