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. 2018 Jun 28;9(7):326. doi: 10.3390/mi9070326

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© 2018 by the authors.

Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (http://creativecommons.org/licenses/by/4.0/).

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OpenSCAD designs of prints for exterior and interior resolution features. (a) Ridge device. The ridges are shown in red and there is a support box around the ridges. The ridges are 100 μm tall and have widths of 1–10 pixels (7.6–76 μm) from left to right. The cutout shows a zoom view; (b) Trench device with the trenches shown in orange. The trenches are 100 μm deep and have widths of 1–10 pixels (7.6–76 μm) from left to right. The cutout shows a zoom view; (c) Interior features device. The top layers of the device have been removed in the schematic to show the features. From left to right the regions are ridges, trenches with exposure compensation, pillars, and trenches without exposure compensation. Each set of features has a series of ceiling support ridges running the length of the feature area. Below each feature void area is a zoom view; (d) Bead trap device design showing 6 channels and traps within channels. Inserts show a zoom view of the three different trap layouts; (e) Schematic of bead trap. The large gap is designed to allow the beads to enter and the smaller gap allows fluid to pass through the trap.

OpenSCAD designs of prints for exterior and interior resolution features. (a) Ridge device. The ridges are shown in red and there is a support box around the ridges. The ridges are 100 μm tall and have widths of 1–10 pixels (7.6–76 μm) from left to right. The cutout shows a zoom view; (b) Trench device with the trenches shown in orange. The trenches are 100 μm deep and have widths of 1–10 pixels (7.6–76 μm) from left to right. The cutout shows a zoom view; (c) Interior features device. The top layers of the device have been removed in the schematic to show the features. From left to right the regions are ridges, trenches with exposure compensation, pillars, and trenches without exposure compensation. Each set of features has a series of ceiling support ridges running the length of the feature area. Below each feature void area is a zoom view; (d) Bead trap device design showing 6 channels and traps within channels. Inserts show a zoom view of the three different trap layouts; (e) Schematic of bead trap. The large gap is designed to allow the beads to enter and the smaller gap allows fluid to pass through the trap.